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Analysis of backscattered ultrasound amplitude of Ti-5.8Al-4Sn-3.5Zr-0.7Nb-0.5Mo-0.3Si samples in terms of their microstructures and local textures

Humbert, M. and Moreau, A. and Uta, E. and Gey, N. and Bocher, Philippe and Bescond, C.. 2009. « Analysis of backscattered ultrasound amplitude of Ti-5.8Al-4Sn-3.5Zr-0.7Nb-0.5Mo-0.3Si samples in terms of their microstructures and local textures ». Acta Materialia, vol. 57, nº 3. pp. 708-714.
Compte des citations dans Scopus : 5.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Bocher, Philippe
Affiliation: Génie mécanique
Date Deposited: 13 Jun 2012 18:13
Last Modified: 28 Oct 2016 18:50
URI: http://espace2.etsmtl.ca/id/eprint/1578

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