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On the analysis and the mitigation of power supply noise and power distribution network impedance variation for scan-based delay testing techniques

Thibeault, Claude et Gagnon, Ghyslain. 2018. « On the analysis and the mitigation of power supply noise and power distribution network impedance variation for scan-based delay testing techniques ». IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 26, nº 7. pp. 1377-1390.
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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Thibeault, Claude
Gagnon, Ghyslain
Affiliation: Génie électrique, Génie électrique
Date Deposited: 30 Jul 2018 21:02
Last Modified: 30 Jul 2018 21:10
URI: http://espace2.etsmtl.ca/id/eprint/17135

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