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Characterization of thin-film optical properties by THz near-field imaging

Amirkhan, F., Nechache, R., Sakata, R., Takiguchi, K., Arikawa, T., Ozaki, T., Tanaka, K. et Blanchard, F.. 2018. « Characterization of thin-film optical properties by THz near-field imaging ». In 2018 Photonics North Conference (PN) (Montreal, QC, Canada, June 5-7, 2018) IEEE.

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Item Type: Conference proceeding
Professor:
Professor
Blanchard, François
Affiliation: Génie électrique
Date Deposited: 04 Sep 2018 14:30
Last Modified: 22 Jan 2020 19:31
URI: http://espace2.etsmtl.ca/id/eprint/17300

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