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Enhanced micro modeling technique for semiconductor devices to study faulty mode in power converters

Charfi, F., Messaoud, M. B., François, B., Al-Haddad, Kamal et Sellami, F.. 2007. « Enhanced micro modeling technique for semiconductor devices to study faulty mode in power converters ». International Review of Electrical Engineering, vol. 2, nº 3. pp. 327-336.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Al Haddad, Kamal
Affiliation: Génie électrique
Date Deposited: 13 Jun 2012 18:14
Last Modified: 01 Oct 2015 20:01
URI: http://espace2.etsmtl.ca/id/eprint/1731

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