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Terahertz microscopy assisted by semiconductor nonlinearities

Blanchard, François, Chai, Xin, Tanaka, Tomoko, Arikawa, Takashi, Ozaki, Tsuneyuki, Morandotti, Roberto et Tanaka, Koichiro. 2018. « Terahertz microscopy assisted by semiconductor nonlinearities ». Optics Letters, vol. 43, nº 20. pp. 4997-5000.
Compte des citations dans Scopus : 1.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Blanchard, François
Affiliation: Génie électrique
Date Deposited: 16 Oct 2018 16:04
Last Modified: 16 Oct 2018 16:04
URI: http://espace2.etsmtl.ca/id/eprint/17394

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