FRANÇAIS
A showcase of ÉTS researchers’ publications and other contributions
SEARCH

Characterization of thin film materials using near field THz imaging

Amirkhan, F., Sakata, R., Takiguchi, K., Arikawa, T., Ozaki, T., Tanaka, K. et Blanchard, F.. 2019. « Characterization of thin film materials using near field THz imaging ». Affiche présentée lors de la conférence : LACIME First Annual Congress (Montreal, QC, Canada, Fev. 21, 2019).

The full text of this document is not available here.
Item Type: Poster
Professor:
Professor
Blanchard, François
Affiliation: Génie électrique
Date Deposited: 06 Aug 2019 18:35
Last Modified: 06 Aug 2019 18:35
URI: http://espace2.etsmtl.ca/id/eprint/19065

Actions (login required)

View Item View Item