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Characterization of thin film materials using near field THz imaging

Amirkhan, F., Sakata, R., Takiguchi, K., Arikawa, T., Ozaki, T., Tanaka, K. et Blanchard, F.. 2019. « Characterization of thin film materials using near field THz imaging ». In 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW) (Paris, France, Sept. 01-06, 2019) IEEE.

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Item Type: Conference proceeding
Professor:
Professor
Blanchard, François
Affiliation: Génie électrique
Date Deposited: 06 Aug 2019 18:34
Last Modified: 22 Jan 2020 19:31
URI: http://espace2.etsmtl.ca/id/eprint/19074

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