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Near-field imaging of terahertz nonlinearities in doped semiconductor thin film

Blanchard, François et Tanaka, K.. 2019. « Near-field imaging of terahertz nonlinearities in doped semiconductor thin film ». In International congress on advanced Materials Sciences and Engineering (AMSE) (Osaka, Japan, July 22-24, 2019)

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Item Type: Conference proceeding
Professor:
Professor
Blanchard, François
Affiliation: Génie électrique
Date Deposited: 06 Aug 2019 18:34
Last Modified: 22 Jan 2020 19:31
URI: http://espace2.etsmtl.ca/id/eprint/19075

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