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Material characterization using 2D near-field THz imaging

Blanchard, François. 2019. « Material characterization using 2D near-field THz imaging ». Communication lors de la conférence : International Workshop on Terahertz Technology (IWOTT) (Lake Louise, AB, Canada, 12-15 avril 2019).

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Item Type: Communication (Communication)
Additional Information: Conférencier invité
Professor:
Professor
Blanchard, François
Affiliation: Génie électrique
Date Deposited: 08 Aug 2019 13:41
Last Modified: 22 Jan 2020 19:31
URI: http://espace2.etsmtl.ca/id/eprint/19081

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