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Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin2ψ and cosα methods

Delbergue, Dorian, Texier, Damien, Lévesque, Martin et Bocher, Philippe. 2019. « Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin2ψ and cosα methods ». Journal of Applied Crystallography, vol. 52, nº 4. pp. 828-843.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Bocher, Philippe
Affiliation: Génie mécanique
Date Deposited: 04 Oct 2019 18:49
Last Modified: 04 Oct 2019 18:49
URI: https://espace2.etsmtl.ca/id/eprint/19504

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