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Characterization of thin-film optical properties by THz near-field imaging method

Amirkhan, F., Sakata, R., Takiguchi, K., Arikawa, T., Ozaki, T., Tanaka, K. et Blanchard, F.. 2019. « Characterization of thin-film optical properties by THz near-field imaging method ». Journal of the Optical Society of America B: Optical Physics, vol. 36, nº 9. pp. 2593-2601.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Blanchard, François
Affiliation: Génie électrique
Date Deposited: 25 Oct 2019 21:03
Last Modified: 22 Jan 2020 19:31
URI: http://espace2.etsmtl.ca/id/eprint/19659

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