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An accurate on-wafer deembedding technique with application to HBT devices characterization

Bousnina, Sami, Falt, Chris, Mandeville, Pierre, Kouki, Ammar B. et Ghannouchi, Fadhel M.. 2002. « An accurate on-wafer deembedding technique with application to HBT devices characterization ». IEEE Transactions on Microwave Theory and Techniques, vol. 50, nº 2. pp. 420-424.
Compte des citations dans Scopus : 27.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Kouki, Ammar B.
Affiliation: Génie électrique
Date Deposited: 29 Oct 2012 20:47
Last Modified: 29 Oct 2012 20:47
URI: http://espace2.etsmtl.ca/id/eprint/2152

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