Bousnina, Sami, Falt, Chris, Mandeville, Pierre, Kouki, Ammar B. et Ghannouchi, Fadhel M..
2002.
« An accurate on-wafer deembedding technique with application to HBT devices characterization ».
IEEE Transactions on Microwave Theory and Techniques, vol. 50, nº 2.
pp. 420-424.
Compte des citations dans Scopus : 27.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/22.982218
| Item Type: | Peer reviewed article published in a journal | ||
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| Affiliation: | Génie électrique | ||
| Date Deposited: | 29 Oct 2012 20:47 | ||
| Last Modified: | 29 Oct 2012 20:47 | ||
| URI: | http://espace2.etsmtl.ca/id/eprint/2152 |
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