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Robust design of terminal ILC with an internal model control using μ-analysis and a genetic algorithm approach

Gauthier, Guy et Boulet, Benoît. 2010. « Robust design of terminal ILC with an internal model control using μ-analysis and a genetic algorithm approach ». In American Control Conference (ACC) (Baltimore, Maryland, USA, June 30-July 2, 2010), pp. 2069-2075. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 3.

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Item Type: Conference proceeding
Additional Information: ACC 2010
Professor:
Professor
Gauthier, Guy
Affiliation: Génie de la production automatisée
Date Deposited: 23 May 2012 17:55
Last Modified: 23 May 2012 17:55
URI: http://espace2.etsmtl.ca/id/eprint/222

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