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A fast method to evaluate the optimum number of spares in defect-tolerant integrated-circuits

Thibeault, Claude, Savaria, Yvon et Houle, Jean louis. 1994. « A fast method to evaluate the optimum number of spares in defect-tolerant integrated-circuits ». IEEE Transactions on Computers, vol. 43, nº 6. pp. 687-697.
Compte des citations dans Scopus : 3.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 29 Oct 2012 20:47
Last Modified: 29 Oct 2012 20:47
URI: http://espace2.etsmtl.ca/id/eprint/2231

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