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Equivalence proofs of some yield modeling methods for defect-tolerant integrated circuits

Thibeault, Claude, Savaria, Yvon et Houle, Jean louis. 1995. « Equivalence proofs of some yield modeling methods for defect-tolerant integrated circuits ». IEEE Transactions on Computers, vol. 44, nº 5. pp. 724-728.
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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 29 Oct 2012 20:47
Last Modified: 29 Oct 2012 20:47
URI: http://espace2.etsmtl.ca/id/eprint/2232

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