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Use of structural tests in RTL verification

Hobeika, Christelle and Thibeault, Claude and Boland, Jean-François. 2008. « Use of structural tests in RTL verification ». In 1st Microsystems and Nanoelectronics Research Conference (MNRC) (Ottawa, Canada, Oct. 15, 2008), pp. 133-136. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 2.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Boland, Jean-François
Affiliation: Génie électrique
Date Deposited: 30 Oct 2012 18:18
Last Modified: 05 Apr 2018 15:08
URI: http://espace2.etsmtl.ca/id/eprint/2757

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