FRANÇAIS
A showcase of ÉTS researchers’ publications and other contributions
SEARCH

Evaluating the usefulness of a functional size measurement procedure to detect defects in MDD models

Marìn, Beatriz, Giachetti, Giovanni, Pastor, Oscar, Vos, Tanja E. J. et Abran, Alain. 2010. « Evaluating the usefulness of a functional size measurement procedure to detect defects in MDD models ». In 4th International Symposium on Empirical Software Engineering and Measurement (ESEM) (Bolzano-Bozen, Italy, Sept. 16-17, 2010) New York, NY, USA : Association for Computing Machinery.

The full text of this document is not available here.
Rechercher dans Google Scholar
Item Type: Conference proceeding
Additional Information: ESEM 2010
Professor:
Professor
Abran, Alain
Affiliation: Génie logiciel et des technologies de l'information
Date Deposited: 23 May 2012 17:55
Last Modified: 23 May 2012 17:55
URI: https://espace2.etsmtl.ca/id/eprint/291

Actions (login required)

View Item View Item