Bernier, Simon, Parpal, Jean-Luc, David, Éric, Jean, Daniel et Lalancette, Daniel.
2008.
« Dielectric response of laboratory aged PE cables ».
In Conference Record of the 2008 IEEE International Symposium on Electrical Insulation (ISEI) (Vancouver, Canada, June 9-12, 2008), pp. 645-649.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 2.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/ELINSL.2008.4570414
Item Type: | Conference proceeding | ||
---|---|---|---|
Professor: |
|
||
Affiliation: | Génie mécanique | ||
Date Deposited: | 30 Oct 2012 18:19 | ||
Last Modified: | 30 Oct 2012 18:19 | ||
URI: | http://espace2.etsmtl.ca/id/eprint/3038 |
Actions (login required)
![]() |
View Item |