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Evolution of slot partial discharges under electrical, thermal and mechanical stresses

Lévesque, M., Hudon, C., Belec, M. et David, Éric. 2008. « Evolution of slot partial discharges under electrical, thermal and mechanical stresses ». In Conference Record of the 2008 IEEE International Symposium on Electrical Insulation (ISEI) (Vancouver, Canada, June 9-12, 2008), pp. 153-157. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 3.

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Item Type: Conference proceeding
Professor:
Professor
David, Éric
Affiliation: Génie mécanique
Date Deposited: 30 Oct 2012 18:19
Last Modified: 30 Oct 2012 18:19
URI: http://espace2.etsmtl.ca/id/eprint/3083

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