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Dielectric characterization of high density polyethylene/SiO2 nanocomposites

Sami, A., David, Éric et Fréchette, Michel F.. 2009. « Dielectric characterization of high density polyethylene/SiO2 nanocomposites ». In IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) (Virginia Beach, VA, USA, Oct. 18-21, 2009), pp. 689-692. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 7.

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Item Type: Conference proceeding
Professor:
Professor
David, Éric
Affiliation: Génie mécanique
Date Deposited: 30 Oct 2012 18:19
Last Modified: 30 Oct 2012 18:19
URI: http://espace2.etsmtl.ca/id/eprint/3108

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