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Heuristic prediction of the optimum number of spares in defect-tolerant integrated circuits

Thibeault, Claude, Savaria, Yvon et Houle, J. L.. 1992. « Heuristic prediction of the optimum number of spares in defect-tolerant integrated circuits ». Journal of Circuits, Systems and Computers, vol. 2, nº 2. pp. 81-100.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 19 Feb 2013 16:25
Last Modified: 19 Feb 2013 16:25
URI: http://espace2.etsmtl.ca/id/eprint/3209

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