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Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites

Sami, A., David, Éric et Fréchette, Michel F.. 2010. « Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites ». In IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) (West Lafayette, USA, Oct. 17-20, 2010), pp. 1-4. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers (IEEE).
Compte des citations dans Scopus : 5.

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Item Type: Conference proceeding
Additional Information: 2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Professor:
Professor
David, Éric
Affiliation: Génie mécanique
Date Deposited: 23 May 2012 17:55
Last Modified: 02 Jun 2016 15:16
URI: http://espace2.etsmtl.ca/id/eprint/342

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