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Test quality of hierarchical defect-tolerant integrated circuits

Thibeault, Claude, Savaria, Yvon et Houle, Jean louis. 1992. « Test quality of hierarchical defect-tolerant integrated circuits ». Journal of Electronic Testing, vol. 3, nº 1. pp. 93-102.
Compte des citations dans Scopus : 3.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 19 Feb 2013 16:26
Last Modified: 19 Feb 2013 16:26
URI: http://espace2.etsmtl.ca/id/eprint/3584

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