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Using fourier analyses to enhance IC testability

Thibeault, Claude. 1995. « Using fourier analyses to enhance IC testability ». Journal of Microelectronic Systems Integration, vol. 3, nº 2. pp. 83-96.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 19 Feb 2013 16:26
Last Modified: 19 Feb 2013 16:26
URI: http://espace2.etsmtl.ca/id/eprint/3585

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