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Integrated circuit testing system and method

Thibeault, Claude (inventeur) 8 November 2005. « Integrated circuit testing system and method ». Socovar S.E.C. (titulaire(s)). Brevet américain US 6,964,003.

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Item Type: Patents (Brevet américain)
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 16 Apr 2013 18:55
Last Modified: 04 Nov 2014 19:51
URI: http://espace2.etsmtl.ca/id/eprint/3892

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