FRANÇAIS
A showcase of ÉTS researchers’ publications and other contributions
SEARCH

Using sinusoidal stimuli and Fourier analyses for memory IC testing

Thibeault, Claude. 1994. « Using sinusoidal stimuli and Fourier analyses for memory IC testing ». In IEEE International Workshop on Memory Technology, Design and Testing (San Jose, CA, USA, Aug. 8-9, 1994), pp. 92-97. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 1.

The full text of this document is not available here.
Rechercher dans Google Scholar
Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:04
Last Modified: 18 Apr 2013 19:04
URI: http://espace2.etsmtl.ca/id/eprint/4714

Actions (login required)

View Item View Item