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Increasing current testing resolution

Thibeault, Claude. 1998. « Increasing current testing resolution ». In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Austin, TX, USA, Nov. 2-4, 1998), pp. 126-134. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 4.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:04
Last Modified: 18 Apr 2013 19:04
URI: http://espace2.etsmtl.ca/id/eprint/4716

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