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On the comparison of IDDQ and IDDQ testing

Thibeault, Claude. 1999. « On the comparison of IDDQ and IDDQ testing ». In 17th IEEE VLSI Test Symposium (Dana Point, CA, USA, Apr. 25-29, 1999), pp. 143-150. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:04
Last Modified: 18 Apr 2013 19:04
URI: http://espace2.etsmtl.ca/id/eprint/4717

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