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An histogram based procedure for current testing of active defects

Thibeault, Claude. 1999. « An histogram based procedure for current testing of active defects ». In International Test Conference (Atlantic City, NJ, USA, Sept. 28-30, 1999), pp. 714-723. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:04
Last Modified: 18 Apr 2013 19:04
URI: https://espace2.etsmtl.ca/id/eprint/4718

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