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On new current signatures and adaptive test technique combination

Thibeault, Claude. 2004. « On new current signatures and adaptive test technique combination ». In 22nd IEEE VLSI Test Symposium (Napa Valley, CA, USA, Apr. 25-29, 2004), pp. 59-64. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 4.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:04
Last Modified: 18 Apr 2013 19:04
URI: https://espace2.etsmtl.ca/id/eprint/4722

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