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On the potential of flush delay for characterization and test optimization

Thibeault, Claude. 2004. « On the potential of flush delay for characterization and test optimization ». In IEEE International Workshop on Current and Defect Based Testing (DBT) (Napa Valley, CA, USA, Apr. 25, 2004), pp. 55-60. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 3.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:04
Last Modified: 18 Apr 2013 19:04
URI: http://espace2.etsmtl.ca/id/eprint/4723

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