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Can the current behavior of faulty and fault-free ICs and the impact on diagnosis

Thibeault, Claude et Boisvert, L.. 1998. « Can the current behavior of faulty and fault-free ICs and the impact on diagnosis ». In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Austin, TX, USA, Nov. 2-4, 1998), pp. 202-210. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 4.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:04
Last Modified: 18 Apr 2013 19:04
URI: http://espace2.etsmtl.ca/id/eprint/4724

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