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Enhancing ISO/IEC 25021 quality measure elements for wider application within ISO 25000 series

St-Louis, Dominique et Suryn, Witold. 2012. « Enhancing ISO/IEC 25021 quality measure elements for wider application within ISO 25000 series ». In 38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012 (Montreal, QC, Canada, Oct. 25-28, 2012), pp. 3120-3125. Washington, DC : IEEE Computer Society.
Compte des citations dans Scopus : 1.

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Item Type: Conference proceeding
Professor:
Professor
Suryn, Witold
Affiliation: Génie logiciel et des technologies de l'information
Date Deposited: 24 Jul 2013 20:43
Last Modified: 24 Jul 2013 20:43
URI: https://espace2.etsmtl.ca/id/eprint/5070

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