FRANÇAIS
A showcase of ÉTS researchers’ publications and other contributions
SEARCH

Electrical resistivity characterization of silicon carbide by various methods

Bouanga, C. Vanga, Savoie, S., Fréchette, M. F., Couderc, H. et David, Éric. 2012. « Electrical resistivity characterization of silicon carbide by various methods ». In Conference Record of the 2012 IEEE International Symposium on Electrical Insulation (ISEI) (San Juan, PR, USA, June 10-13, 2012 ), pp. 43-47. Piscataway, N.J. : Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 4.

The full text of this document is not available here.
Rechercher dans Google Scholar
Item Type: Conference proceeding
Professor:
Professor
David, Éric
Affiliation: Génie mécanique
Date Deposited: 24 Jul 2013 20:44
Last Modified: 24 Jul 2013 20:44
URI: http://espace2.etsmtl.ca/id/eprint/5223

Actions (login required)

View Item View Item