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Quick Profiler (QuiP) : a friendly tool to extract roughness statistical parameters using a needle profiler

Trudel, Mélanie, Charbonneau, François, Avendano, Fernando et Leconte, Robert. 2010. « Quick Profiler (QuiP) : a friendly tool to extract roughness statistical parameters using a needle profiler ». Canadian Journal of Remote Sensing = Journal Canadien de Télédétection, vol. 36, nº 4. pp. 391-396.
Compte des citations dans Scopus : 12.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Leconte, Robert
Affiliation: Génie de la construction
Date Deposited: 23 May 2012 17:56
Last Modified: 23 May 2012 17:56
URI: http://espace2.etsmtl.ca/id/eprint/543

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