Inverted scanning microwave microscopy for nanometer-scale imaging and characterization of platinum diselenide

Fabi, Gianluca, Jin, Xin, Hwang, James C. M., Joseph, C. H., Pavoni, Eleonora, Li, Lei, Xiong, Kuanchen, Ning, Yaqing, Mencarelli, Davide, Di Donato, Andrea, Morini, Antonio, Zhao, Yan, Al Hadi, Richard and Farina, Marco. 2019. « Inverted scanning microwave microscopy for nanometer-scale imaging and characterization of platinum diselenide ». In IEEE MTT-S International Microwave Symposium Digest (Boston, MA, USA, June 02-07, 2019) pp. 1115-1117. Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 4.

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Item Type:	Conference proceeding
Professor:	Professor Al Hadi, Richard
Affiliation:	Autres
Date Deposited:	05 Jun 2024 13:28
Last Modified:	05 Jun 2024 13:28
URI:	https://espace2.etsmtl.ca/id/eprint/28712

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