Methods for determining the exposure to THz radiation utilizing CMOS-based detectors

Statnikov, Konstantin, Al Hadi, Richard, Clemens, Markus, Hansen, Volkert, Spathmann, Oliver, Streckert, Joachim, Zang, Martin and Pfeiffer, Ullrich R.. 2013. « Methods for determining the exposure to THz radiation utilizing CMOS-based detectors ». In 38th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) (Mainz, Germany, Sept. 01-06, 2013) Institute of Electrical and Electonics Engineers.
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Item Type:	Conference proceeding
Professor:	Professor Al Hadi, Richard
Affiliation:	Autres
Date Deposited:	05 Jun 2024 13:27
Last Modified:	05 Jun 2024 13:27
URI:	https://espace2.etsmtl.ca/id/eprint/28727

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