A closer look at the few-shot adaptation of large vision-language models

Silva-Rodriguez, Julio, Hajimiri, Sina, Ben Ayed, Ismail and Dolz, José. 2024. « A closer look at the few-shot adaptation of large vision-language models ». In IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (Seattle, WA, USA, June 16-22, 2024) pp. 23681-23690. Institute of Electrical and Electonics Engineers Inc..
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Item Type:	Conference proceeding
ISBN:	979-8-3503-5300-6
Professor:	Professor Ben Ayed, Ismail Dolz, José
Affiliation:	Génie des systèmes, Génie logiciel et des technologies de l'information
Date Deposited:	13 Feb 2025 16:45
Last Modified:	13 Feb 2025 16:45
URI:	https://espace2.etsmtl.ca/id/eprint/30520

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