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On captureless delay test points

Thibeault, Claude, Hariri, Y. et Hobeika, Christelle. 2009. « On captureless delay test points ». In Joint IEEE North-East Workshop on Circuits and Systems and Taisa Conference (NEWCAS-TAISA) (Toulouse, France, June 28-July 01, 2009), pp. 280-283. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 30 Oct 2012 18:19
Last Modified: 30 Oct 2012 18:19
URI: http://espace2.etsmtl.ca/id/eprint/2944

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