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CoMet : a tool using CUMM to measure unused components members

Msheik, Hamdam, Abran, Alain, Mcheick, Hamad, Touloumis, Dimitrios et Khelifi, Adel. 2006. « CoMet : a tool using CUMM to measure unused components members ». In IEEE International Conference on Computer Systems and Applications (Sharjah, United Arab Emirates, March 8, 2006), pp. 697-703. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type: Conference proceeding
Professor:
Professor
Abran, Alain
Affiliation: Génie logiciel et des technologies de l'information
Date Deposited: 30 Oct 2012 18:19
Last Modified: 30 Oct 2012 18:19
URI: http://espace2.etsmtl.ca/id/eprint/3013

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