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Testing for parasitic memory effect in SRAMs

Irobi, Sandra, Al-Ars, Zaid, Hamdioui, Said et Thibeault, Claude. 2011. « Testing for parasitic memory effect in SRAMs ». In 20th Asian Test Symposium (ATS) (New Delhi, India, Nov. 20-23, 2011), pp. 407-412. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 1.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:02
Last Modified: 18 Apr 2013 19:02
URI: https://espace2.etsmtl.ca/id/eprint/4210

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