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Multi-abstraction level signature generation and comparison based on radiation single event upset

Hobeika, C., Pichette, S., Leonard, M. A., Thibeault, Claude, Boland, Jean-François et Audet, Y.. 2014. « Multi-abstraction level signature generation and comparison based on radiation single event upset ». In 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) (Platja d'Aro, Girona, Spain, July 7-9, 2014), pp. 212-215. Piscataway, N. J., USA : IEEE.
Compte des citations dans Scopus : 3.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Boland, Jean-François
Affiliation: Génie électrique
Date Deposited: 12 Sep 2014 18:52
Last Modified: 05 Apr 2018 15:08
URI: http://espace2.etsmtl.ca/id/eprint/8465

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