Lafleur, F., Thomas, M. et Laville, F..
1998.
« Modal analysis of electrical circuits using acoustical sources: methods, results and use ».
In 4th Annual workshop on accelerated stress testing, AST'98 (Pasadena, CA, USA, Sept. 22-24, 1998)
IEEE.
The full text of this document is not available here.
Item Type: |
Conference proceeding
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Professor: |
Thomas, Marc | Laville, Frédéric |
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Affiliation: |
Génie mécanique |
Date Deposited: |
21 Sep 2015 15:41 |
Last Modified: |
03 Aug 2017 15:12 |
URI: |
https://espace2.etsmtl.ca/id/eprint/11090 |
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