Potvin, Marc et Tahan, Antoine.
2010.
« Investigation metrology ».
Communication lors de la conférence :
3D Imaging Conference and Exposition (Anaheim, Ca., USA, May 18-20, 2010).
The full text of this document is not available here.
| Item Type: |
Communication
(Communication)
|
| Additional Information: |
Présenté avec RAPID 2010 Conference & Exposition |
| Professor: |
|
| Affiliation: |
Génie mécanique |
| Date Deposited: |
23 May 2012 17:54 |
| Last Modified: |
14 Sep 2017 14:24 |
| URI: |
https://espace2.etsmtl.ca/id/eprint/112 |
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