Potvin, Marc et Tahan, Antoine. 2010. « Investigation metrology ». Communication lors de la conférence : 3D Imaging Conference and Exposition (Anaheim, Ca., USA, May 18-20, 2010).
The full text of this document is not available here.| Item Type: | Communication (Communication) |
|---|---|
| Additional Information: | Présenté avec RAPID 2010 Conference & Exposition |
| Professor: | Professor Tahan, Antoine |
| Affiliation: | Génie mécanique |
| Date Deposited: | 23 May 2012 17:54 |
| Last Modified: | 14 Sep 2017 14:24 |
| URI: | https://espace2.etsmtl.ca/id/eprint/112 |
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