Souari, Anis, Thibeault, Claude, Blaquière, Yves and Velazco, Raoul.
2015.
« Optimization of SEU emulation on SRAM FPGAs based on sensitiveness analysis ».
In 2015 IEEE 21st International On-Line Testing Symposium (IOLTS) (Halkidiki, Greece, July 6-8, 2015)
pp. 36-39.
Piscataway, NJ, USA : IEEE.
Compte des citations dans Scopus : 2.
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Official URL: http://dx.doi.org/10.1109/IOLTS.2015.7229827
Item Type: | Conference proceeding |
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Professor: | Professor Thibeault, Claude Blaquière, Yves |
Affiliation: | Génie électrique, Autres |
Date Deposited: | 20 Oct 2015 18:10 |
Last Modified: | 20 Feb 2017 19:59 |
URI: | https://espace2.etsmtl.ca/id/eprint/11637 |
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