Remnant thickness mapping using high order shear horizontal modes

Belanger, Pierre. 2015. « Remnant thickness mapping using high order shear horizontal modes ». In ASNT 24th research symposium (Anaheim, CA, USA, Mar. 16-19, 2015) American Society for Nondestructive Testing.

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Item Type:	Conference proceeding
Professor:	Professor Bélanger, Pierre
Affiliation:	Génie mécanique
Date Deposited:	08 Apr 2016 20:23
Last Modified:	08 Apr 2016 20:23
URI:	https://espace2.etsmtl.ca/id/eprint/12547

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