FRANÇAIS
A showcase of ÉTS researchers’ publications and other contributions
SEARCH

An automated fault injection for evaluation of LUTs robustness in SRAM-based FPGAs

Souari, Anis, Thibeault, Claude, Blaquière, Yves et Velazco, Raoul. 2015. « An automated fault injection for evaluation of LUTs robustness in SRAM-based FPGAs ». In 2015 IEEE East-West Design & Test Symposium (EWDTS) (Batumi, GA, USA, Sept. 26-29, 2015) IEEE.
Compte des citations dans Scopus : 2.

The full text of this document is not available here.
Rechercher dans Google Scholar
Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Blaquière, Yves
Affiliation: Génie électrique, Autres
Date Deposited: 06 Jul 2016 12:53
Last Modified: 20 Feb 2017 19:57
URI: https://espace2.etsmtl.ca/id/eprint/12984

Actions (login required)

View Item View Item