An automated fault injection for evaluation of LUTs robustness in SRAM-based FPGAs

Souari, Anis, Thibeault, Claude, Blaquière, Yves and Velazco, Raoul. 2015. « An automated fault injection for evaluation of LUTs robustness in SRAM-based FPGAs ». In 2015 IEEE East-West Design & Test Symposium (EWDTS) (Batumi, GA, USA, Sept. 26-29, 2015) IEEE.
Compte des citations dans Scopus : 3.

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Item Type:	Conference proceeding
Professor:	Professor Thibeault, Claude Blaquière, Yves
Affiliation:	Génie électrique, Autres
Date Deposited:	06 Jul 2016 12:53
Last Modified:	20 Feb 2017 19:57
URI:	https://espace2.etsmtl.ca/id/eprint/12984

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