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Low-stress CMOS-compatible silicon carbide surface-micromachining technology-part II: beam resonators for MEMS above IC

Nabki, Frederic, Cicek, Paul-Vahe, Dusatko, Tomas A. et El-Gamal, Mourad N.. 2011. « Low-stress CMOS-compatible silicon carbide surface-micromachining technology-part II: beam resonators for MEMS above IC ». Journal of Microelectromechanical Systems, vol. 20, nº 3. pp. 730-744.
Compte des citations dans Scopus : 18.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Nabki, Frédéric
Affiliation: Autres
Date Deposited: 13 Jul 2016 17:38
Last Modified: 13 Jul 2016 17:38
URI: https://espace2.etsmtl.ca/id/eprint/13199

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