Hai, Zhang, Fernandes, Henrique, Lingyao, Yu, Hassler, Ulf, Genest, Marc, Robitaille, François, Joncas, Simon, Yunlong, Sheng and Maldague, Xavier.
2016.
« A comparative study of experimental and finite element analysis on submillimeter flaws by laser and ultrasonic excited thermography ».
In Thermosense: Thermal Infrared Applications XXXVIII (Baltimore, MD, USA, Apr. 18-21, 2016)
Coll. « Proceedings of SPIE », vol. 9861.
USA : SPIE.
Compte des citations dans Scopus : 6.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1117/12.2223209
| Item Type: | Conference proceeding |
|---|---|
| ISBN: | 0277-786X |
| Professor: | Professor Joncas, Simon |
| Affiliation: | Génie de la production automatisée |
| Date Deposited: | 05 Oct 2016 18:13 |
| Last Modified: | 07 Sep 2023 17:45 |
| URI: | https://espace2.etsmtl.ca/id/eprint/13812 |
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