A comparative study of experimental and finite element analysis on submillimeter flaws by laser and ultrasonic excited thermography

Hai, Zhang, Fernandes, Henrique, Lingyao, Yu, Hassler, Ulf, Genest, Marc, Robitaille, François, Joncas, Simon, Yunlong, Sheng et Maldague, Xavier. 2016. « A comparative study of experimental and finite element analysis on submillimeter flaws by laser and ultrasonic excited thermography ». In Thermosense: Thermal Infrared Applications XXXVIII (Baltimore, MD, USA, Apr. 18-21, 2016) Coll. « Proceedings of the SPIE », vol. 9861. USA : SPIE.
Compte des citations dans Scopus : 4.

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Item Type:	Conference proceeding
ISBN:	0277-786X
Professor:	Professor Joncas, Simon
Affiliation:	Génie de la production automatisée
Date Deposited:	05 Oct 2016 18:13
Last Modified:	05 Oct 2016 18:13
URI:	https://espace2.etsmtl.ca/id/eprint/13812

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