Tazi, Fatima Zahra, Thibeault, Claude and Savaria, Yvon.
2016.
« Detailed analysis of radiation-induced delays on I/O blocks of an SRAM-based FPGA ».
In 2016 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE) (Vancouver, BC, Canada, May 15-18, 2016)
Piscataway, NJ, USA : IEEE.
Compte des citations dans Scopus : 3.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/CCECE.2016.7726600
Item Type: | Conference proceeding |
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Professor: | Professor Thibeault, Claude |
Affiliation: | Génie électrique |
Date Deposited: | 02 Dec 2016 19:10 |
Last Modified: | 02 Dec 2016 19:10 |
URI: | https://espace2.etsmtl.ca/id/eprint/14079 |
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