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Detailed analysis of radiation-induced delays on I/O blocks of an SRAM-based FPGA

Tazi, Fatima Zahra, Thibeault, Claude et Savaria, Yvon. 2016. « Detailed analysis of radiation-induced delays on I/O blocks of an SRAM-based FPGA ». In 2016 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE) (Vancouver, BC, Canada, May 15-18, 2016) Piscataway, NJ, USA : IEEE.
Compte des citations dans Scopus : 1.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 02 Dec 2016 19:10
Last Modified: 02 Dec 2016 19:10
URI: https://espace2.etsmtl.ca/id/eprint/14079

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